基于实际工况谱的功率模块寿命预测方法研究

打开文本图片集

中图分类号：U463.61 文献标志码：A DOI：10.19822/j.cnki.1671-6329.20240320

【欢迎引用】，，，等.基于实际工况谱的功率模块寿命预测方法研究[J].汽车文摘，2026（2）：57-62. 【Cite this paper】MAY，WANGJB，ZHUZS，etal.ResearchontheLifetimePrediction MethodofthePowerModule Basedonthe Mission Profile[J]. Automotive Digest （Chinese），2026（2）：57-62.

Research on the Lifetime Prediction Method of the Power Module Based on the Mission Profile

MaYing，WangJiabin，Zhu Zhanshan，Li Min，ZhangYuexin （Global R&D Center，China FAW CorporationLimited，Changchun ）

【Abstract】To achieve lifetime predictionof power modules underactual operating conditions，a power module lifetimeprediction method basedonatemperature model is proposed.Simulation parameters such as voltage，phase curent， power factor，and switching frequencyareobtained fromthe vehicle drivingcycledata to calculate module losss.First，the Fosterthermalnetwork model isthenused tocalculate the junction temperature，therebyobtaining themodule temperature variationsequence.Therainflowcounting methodisappliedto extractthejunction temperature fluctuationsequence.Next， the damage degree of the power module under thecoresponding driving cycle is evaluated bycombining the lifetime model fittedfrompower cycling tests.Additionally，thedamagedegreesof thesame moduleunderpowergenerationandelectric driving conditionsarecomparedtoanalyze the performancerequirementsof themoduleindiferentapplicationscenarios. The results show that under a 240 000km driving cycle，the damage degree in electric driving conditions is significantly higher than in powergenerationconditions，andan increase inswitching frequency exacerbates thedamage.This method caneffectively support rapidreliability assessment of power modulesand provide a basisfor module selectionand optimization in different application scenarios.

Key words： Insulated Gate Bipolar Transistor （IGBT）， Transient junction temperature. Junction temperaturefluctuations，Lifetimeprediction

0 引言

功率模块是电动汽车驱动系统的核心部件，其寿命预测研究对于提升整车安全性与可靠性具有重要意义。（剩余7949字）