基于先进工艺的车载芯片可靠性优化设计

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主题词：跟踪/保持电路开关输出缓冲器嵌入式车载芯片可靠性中图分类号：TN792 文献标志码：A DOI：10.19620/j.cnki.1000-3703.20250310

TheReliability Optimization Design of Vehicle Chip Based on Advanced Techonology

Liang Hongyu1，Yang Xiaoyu1²，Feng Zhihual，Wang Yan1，3 （1.National keyLaboratoryof Integrated Circuit and Microsystems，Chongqing 40o06O; 2.Chongqing University， Chongqing 40o06O; 3.University of Electronic Science and Technology of China， Chengdu 611700）

【Abstract】Based on the SMIC12 nmFin Field-Effect Transistor （FinFET）process，this paper analyzes the harmonic distortionandbandwidthperformanceindicatorsofthetrack/holdcircuitatthefrontendoftheAnalog-to-Digital （A/D） converter.Byreasonablyselectingthetypeandsizeofthetrack/holdswitch，theharmonicdistortioncausedbythetemperature variatioofthetrack/holdswitchisreduced，andanewtypeofswitchoutputbuferisproposedtoimprovethelinearityof the track/holdcircuitandthedrivingcapabilityoftheA/Dconverter.Testresultsshowthat：usingthegateandparasitic capacitances of N-type Metal-Oxide-Semiconductor（NMOS）andP-type Metal-Oxide-Semiconductor （PMOS）transistors as samplingcapacitances，theoverallfront-endcircuit bandwidth is increasedto34GHzthrough simulationverification with Cadence Virtuoso; when the sampling frequency fs ：10 GHz and the input signal fin 9.8 GHz， the Spurious-Free Dynamic Range （SFDR）and Total Harmonic Distortion （THD）reach 67dBand-59.5dB，respectively.The proposed design schemecan be applied tothebuilt-inself-testandself-check safetysystemofautonomous driving，reducingthefailurerateoftheautonomous driving systemand improving thereliability of the embedded vehicle chip safety mechanism.

Key words：Tracking/holding circuit，Switching output buffer，Vehicle chip of the embedded system，Reliability

【引用格式】梁宏玉，杨潇雨，冯治华，等.[J].汽车技术，2026（2）：7-12.LIANGHY，YANGXY，FENGZH，etal.TheReliabilityOptimizationDesignofVehicleChipBasedonAdvancedTechonology[J]. Automobile Technology，2026（2）： 7-12.

1前言

高可靠性、高精度内置自检安全系统对于提升嵌入式车载芯片安全机制、降低自动驾驶故障率具有重要意义。（剩余8729字）