运用频闪照明的弹光调制型双折射显微成像

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关键词：显微成像；弹光调制;频闪照明;相位延迟量；双折射 中图分类号：O439；TH742 文献标识码：A doi：10.37188/OPE.20253319.3021 CSTR：32169.14.OPE.20253319.3021

Abstract： To achieve rapid and precise birefringence microscopy，a photoelastic-modulation-based imaging scheme is proposed. Leveraging the high modulation frequency and purity of photoelastic modulators， birefringence imaging measurements are realized. The disparity between the modulator's high-frequency operation and the camera's low frame rate is resolved via stroboscopic illumination. The sample's birefringence phase retardation distribution is retrieved from only three images acquired at photoelastic modulation phases of 0∘ ， 30∘ ，and 90∘ . An experimental system was constructed and tested on a wave plate and linden stem sections. Results indicate a wave-plate retardation error below 1% ，retardation accuracy within ±λ/300 ，anda maximum retardation-distribution deviation not exceeding 1.62nm .Distinct retardation regions in the linden stem sections enabled diferentiation of anatomical parts，with single-measurement acquisition time under 3ms . The method achieves high-speed，high-precision mapping of birefringence phase retardation and ofers an advanced technical approach for studies of two-dimensional materials，bio logical tissue imaging，and related fields.

Key words： microscopy imaging; polarization modulation； stroboscopic illumination； phase retardation;birefringence

1引言

双折射是各向异性样品特有的光学性质[1-3]在显微成像中加入双折射检测的方案，即可同步获取样品微观结构的双折射相位延迟量、快轴方位角等参数。（剩余14574字）